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A distribution function for double-bit upsets

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1 Author(s)
Edmonds, L.D. ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

It is suggested that the chord length distribution method could be useful for predicting double-bit upset rates in certain circumstances. A chord length distribution function for simultaneous path lengths in two parallelepipeds, applicable to a unidirectional flux, is derived. A proof of the system is outlined for the case under consideration

Published in:

Nuclear Science, IEEE Transactions on  (Volume:36 ,  Issue: 2 )