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Particle LET spectra from microelectronics packaging materials subjected to neutron and proton irradiation

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2 Author(s)
Browning, J.S. ; Sandia Nat. Labs., Albuquerque, NM, USA ; Holtkamp, D.B.

Cumulative fractions for linear energy transfer spectra were measured for particles ejected from microelectronics packaging materials subjected to neutron and proton irradiations. The measurements for the neutron irradiations compare well with Monte Carlo theoretical calculations. The spectra can be used to access microelectronics vulnerabilities in strategic-nuclear-weapon, space-trapped, and neutral-beam directed-energy particle environments

Published in:

Nuclear Science, IEEE Transactions on  (Volume:35 ,  Issue: 6 )

Date of Publication:

Dec 1988

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