Cart (Loading....) | Create Account
Close category search window
 

A theoretical study of transducer noise in piezoresistive and capacitive silicon pressure sensors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Spender, R.R. ; Integrated Circuits Lab., Stanford Univ., CA, USA ; Fleischer, B.M. ; Barth, P.W. ; Angell, J.B.

An analysis of the effect of noise introduced by the transduction process on the minimum detectable signal (MDS) of piezoresistive and capacitive pressure sensors has been performed. MDS is first introduced as an appropriate figure of merit for comparing different sensor transduction schemes. Analyses are then performed to determine the minimum MDS theoretically achievable for a broad range of generic transducer circuits. The results of the analyses indicate that noise in the transduction process is not a limiting factor in the performance of properly designed integrated silicon sensors

Published in:

Electron Devices, IEEE Transactions on  (Volume:35 ,  Issue: 8 )

Date of Publication:

Aug 1988

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.