Cart (Loading....) | Create Account
Close category search window

Processing and circuit design enhance a data converter's radiation tolerance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Heuner, R. ; GE Solid State, Somerville, NJ, USA ; Zazzu, V. ; Pennisi, L.

Radiation-hard CMOS/SOS processing was applied to a novel comparator-invertor circuit design to develop 6- and 8-bit parallel circuits featuring high-speed operation, low power consumption, and total-dose radiation tolerance up to 1 Mrad(Si). The heart of the radiation tolerant ADC design is a novel CMOS autozero comparator. The autozero function serves to eliminate any comparator offset. The comparator design is also tolerant of voltage threshold variations associated with total-dose radiation

Published in:

Nuclear Science, IEEE Transactions on  (Volume:35 ,  Issue: 6 )

Date of Publication:

Dec 1988

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.