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Browse Journals & Magazines > Lightwave Technology, Journal ...> Volume:11 Issue:8 Help

Coherent frequency-domain reflectometry for characterization of single-mode integrated-optical waveguides

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2 Author(s)
Glombitza, U. ; Tech, Univ, Hamburg-Harburg, Germany ; Brinkmeyer, E.

Based on the principles of optical frequency domain reflectometry (OFDR), a highly resolving and sensitive technique suitable for detecting, localizing, and quantifying weakly reflecting irregularities in single-mode optical waveguides is developed. A distributed feedback (DFB)-laser diode at λ0≅1.3 μm tuned within a range of Δλ≅6 nm and Δv≅1 THz, respectively, is used as a source in the experimental arrangement. An auxiliary interferometer is employed so that the tuning need not be linear in time, in contrast to early implementations. At present, with waveguide structures on InP under test, a spatial resolution of 50 μm and a dynamic range of about 60 dB are obtained. These data surpass OFDR results published so far. Prospects of closing the gap to coherence-domain reflectometric results and specific advantages make OFDR a promising technique

Published in:
Lightwave Technology, Journal of  (Volume:11 ,  Issue: 8 )

Date of Publication: Aug 1993

Page(s):
1377 - 1384
ISSN :
0733-8724
INSPEC Accession Number:
4580263
Digital Object Identifier :
10.1109/50.254098
Product Type:
Journals & Magazines
Date of Current Version :
06 August 2002
Issue Date :
Aug 1993
Sponsored by :
IEEE Aerospace and Electronic Systems Society

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