By Topic

New type of spectral-domain analysis of a microstrip-line

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
K. Uchida ; Dept. of Commun. & Comput. Eng., Fukuoka Inst. of Technol., Japan ; T. Noda ; T. Matsunaga

The problem of an open microstrip line is analyzed by the spectral-domain method combined with the sampling theorem. In the spectral domain, the boundary conditions of zero tangential electric fields are expressed in terms of the convolution integral forms with a sampling function, and these relations are discretized by the method of moments with the spherical Bessel function as a weighting function. A well-chosen incorporation of the Weber-Schafheitlin integration formula yields good accuracy and saves a significant amount of time in numerical calculations. Numerical examples are shown for the effective dielectric constants and for the current distributions, both longitudinal and transverse, in comparison with the results obtained by other methods

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:37 ,  Issue: 6 )