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Gentest: an automatic test-generation system for sequential circuits

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2 Author(s)
Wu-Tung Cheng ; AT&T Bell Lab., Princeton, NJ, USA ; Chakraborty, T.J.

A description is given of Gentest, with emphasis on STG2, a sequential test generator that uses the Back test-generation algorithm and the Split value model. The performance of STG2 on a Convex C-1 computer is compared with that of its predecessor, STG1 and STG1.5. Results are also presented for another set of experiments for Gentest on a Sun 3/60 workstation.<>

Published in:

Computer  (Volume:22 ,  Issue: 4 )