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Yield and productivity management

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1 Author(s)
Effron, M.S. ; IBM Corp., Essex Junction, VT, USA

Summary form only given. The approaches, attitudes, and methodologies used by over 20 semiconductor manufacturers to manage yield and improve productivity have been examined. Selected topics in management systems and measurements, long- and short-loop analysis, data and information generation and handling, and manufacturing operational procedures have been considered

Published in:

Advanced Semiconductor Manufacturing Conference and Workshop, 1992. ASMC 92 Proceedings. IEEE/SEMI 1992

Date of Conference:

30 Sep-1 Oct 1992

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