Cart (Loading....) | Create Account
Close category search window
 

Distribution system harmonic worst case design using a genetic algorithm

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Richards, G.G. ; Dept. of Electr. Eng., New Orleans Univ., LA, USA ; Yang, H.

IEEE Standard 519 suggests that utility distribution buses should provide a voltage harmonic distortion level of less than 5% provided customers on the distribution feeder limit their load harmonic current injections to a prescribed level. It is desirable to anticipate voltage harmonics on distribution lines that have constantly changing characteristics due to line switching, capacitor switching, and load impedance changes, and are also subject to multiple harmonic sources with changing magnitudes and spectra. A technique is outlined for finding worst case combinations of these distribution system variables in order to design solutions to potential harmonic excesses. The number of harmonic source-load combinations makes it desirable to use a genetic algorithm for this purpose.<>

Published in:

Power Delivery, IEEE Transactions on  (Volume:8 ,  Issue: 3 )

Date of Publication:

July 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.