Cart (Loading....) | Create Account
Close category search window
 

A novel method for the characterization of LSE-type dielectric waveguides

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Van Deventer, T.E. ; Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA ; Katehi, P.B.

A novel method is developed to calculate the propagation characteristics of dielectric ridge structures in high-frequency monolithic integrated circuits. The electric field in the dielectric ridge is expressed in terms of a polarization current from which an equivalent surface current density is defined. Generalized boundary conditions are enforced in order to provide a simple integral equation. Results derived by this modified integral equation approach give excellent agreement with other numerical methods. The main advantage of this technique is that it greatly simplifies the analysis of three-dimensional complex structures

Published in:

Magnetics, IEEE Transactions on  (Volume:29 ,  Issue: 2 )

Date of Publication:

Mar 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.