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A novel method for the characterization of LSE-type dielectric waveguides

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2 Author(s)
T. E. van Deventer ; Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA ; L. P. B. Katehi

A novel method is developed to calculate the propagation characteristics of dielectric ridge structures in high-frequency monolithic integrated circuits. The electric field in the dielectric ridge is expressed in terms of a polarization current from which an equivalent surface current density is defined. Generalized boundary conditions are enforced in order to provide a simple integral equation. Results derived by this modified integral equation approach give excellent agreement with other numerical methods. The main advantage of this technique is that it greatly simplifies the analysis of three-dimensional complex structures

Published in:

IEEE Transactions on Magnetics  (Volume:29 ,  Issue: 2 )