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Functional testing for cellular neural networks

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2 Author(s)
J. Willis ; Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA ; J. Pineda de Gyvez

A novel approach to test the functional behaviour of cellular neural networks (CNNs) is proposed. The method attains 100% stuck-at fault coverage regardless of the array size without any extra hardware for its implementation. The Letter discusses the new fault model, presents the algorithmic procedures and shows simulated testing results.

Published in:

Electronics Letters  (Volume:29 ,  Issue: 25 )