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SIERRA: a 3-D device simulator for reliability modeling

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4 Author(s)
Jue-Hsien Chern ; Texas Instrum. Inc., Dallas, TX, USA ; Maeda, J.T. ; Arledge, L.A., Jr. ; Ping Yang, B.S.

SIERRA is a 3-D general-purpose semiconductor-device simulation program which serves as a foundation for investigating integrated-circuit (IC) device and reliability issues. This program solves the Poisson and continuity equations in silicon under DC, transient, and small-signal conditions. Executing on a vector/parallel minisupercomputer, SIERRA utilizes a matrix solver which uses an incomplete LU (ILU) preconditioned conjugate gradient square (CGS, BCG) method. The ILU-CGS method provides a good compromise between memory size and convergence rate. The authors have observed a 5× to 7× speedup over standard direct methods in simulations of transient problems containing highly coupled Poisson and continuity equations such as those found in reliability-oriented simulations. The application of SIERRA to parasitic CMOS latchup and DRAM (dynamic random-access memory) single-event-upset studies is described

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:8 ,  Issue: 5 )