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Analysis of discontinuous-layer propagation structures by transverse resonance method

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4 Author(s)
M. Aubrion ; Lab. d'electron., ENSEEIHT, Toulouse, France ; H. Aubert ; M. Ahmadpanah ; H. Baudrand

The transverse resonance method is used for the accurate analysis of propagation structures with discontinuous substrate layers. The original aspect of the approach is the use of LSE-LSM modes as basis functions combined with appropriate trial functions which leads to small-size matrices and reduces the numerical effort. As an example the propagation characteristics of a microslab waveguide with finite metallisation thickness are calculated.

Published in:

Electronics Letters  (Volume:29 ,  Issue: 24 )