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Low dose rate radiation testing of advanced CMOS technology (AC/ACT) series parts for space flight applications

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2 Author(s)
Sharma, A.K. ; NASA, Goddard Space Flight Center, Greenbelt, MD, USA ; Sahu, K.

The authors describe the low dose radiation test results performed on Advanced CMOS technology (AC/ACT) series parts for a spaceflight project. The parts were procured to Standard Military Drawings (SMD) and MIL-STD-883 specifications. Radiation testing was performed on 32 different part types at dose rates ranging from 0.07 to 1.44 rads(Si)/sec. at steps of 5, 10, 20, 30, 50, 75, 100, 200 and 300 krads(Si). Annealing was performed after the 100 krads(Si) step for 168 hours at 25 degrees C and after the 300 krads(Si) step for 168 hours at 100 degrees C. Most parts passed functional tests up to 100 krads(Si) exposure, but showed increases in quiescent current (Icc) measurements over the pre-irradiation specification limits in the manufacturer's data sheets. This Icc degradation varied for different part types and lot data codes. These test results confirmed the need for lot sample radiation testing of AC/ACT parts for space flight applications.

Published in:

Radiation Effects Data Workshop, 1992. Workshop Record., 1992 IEEE

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