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Design of pseudoexhaustive testable PLA with low overhead

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4 Author(s)
Wen-Zen Shen, ; Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsin Chu, Taiwan ; Gwo-Haur Hwang ; Wen-Jun Hsu ; Yun-Jung Jan

The pseudoexhaustive testing (PET) scheme is an economic approach to test a large embedded PLA. In this paper, the authors propose an efficient algorithm named lower overhead PET (LOPET) to partition the product lines. By applying the algorithm, both the area overhead and test length are reduced significantly

Published in:

VLSI Technology, Systems, and Applications, 1991. Proceedings of Technical Papers, 1991 International Symposium on

Date of Conference:

22-24 May 1991