Referenced Items are not available for this document.
A time domain technique for go-no-go testing of linear analog devices has been analysed in order to identify the conditions that maximise its sensitivity to structural and drift failures. The application to a commercial CMOS operational amplifier showing its ability to cover almost all of the assumed faults, and the ease of generation of the test stimulus on standard ATE equipments, suggest variable applications to production testing
Published in:
European Test Conference, 1993. Proceedings of ETC 93., Third
Date of Conference: 19-22 Apr 1993
- Page(s):
- 116 - 121
- Meeting Date :
- 19 Apr 1993-22 Apr 1993
- Print ISBN:
- 0-8186-3360-3
- INSPEC Accession Number:
- 4509085
- Conference Location :
- Rotterdam
- Digital Object Identifier :
- 10.1109/ETC.1993.246526
- Product Type:
- Conference Publications
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