Referenced Items are not available for this document.
The author presents a new strategy to select a minimal test pattern set as a basis for test pattern generation by specific software or hardware modules. In contrast to other proposals this procedure is totally independent of the used test pattern generation algorithm. Based on the basic deterministic test pattern set, the test generation hardware can be easily realized. It is possible to show that the storage requirements could be drastically reduced on an average of more than 80% compared with the original deterministic test pattern sets
Published in:
Design Automation Conference, 1992., EURO-VHDL '92, EURO-DAC '92. European
Date of Conference: 7-10 Sep 1992
- Page(s):
- 312 - 317
- Meeting Date :
- 07 Sep 1992-10 Sep 1992
- Print ISBN:
- 0-8186-2780-8
- INSPEC Accession Number:
- 4493533
- Conference Location :
- Hamburg
- Digital Object Identifier :
- 10.1109/EURDAC.1992.246226
- Product Type:
- Conference Publications
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