Cart (Loading....) | Create Account
Close category search window
 

An empirical study of testing and integration strategies using artificial software systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Solheim, J.A. ; Emporia State Univ., KS, USA ; Rowland, J.H.

There has been much discussion about the merits of various testing and integration strategies. Top-down, bottom-up, big-bang, and sandwich integration strategies are advocated by various authors. Also, some authors insist that modules be unit tested, while others believe that unit testing diverts resources from more effective verification processes. This article addresses the ability of the aforementioned integration strategies to detect defects, and produce reliable systems. It also explores the efficacy of spot unit testing, and compares phased and incremental versions of top-down and bottom-up integration strategies. Relatively large artificial software systems were constructed using a code generator with ten basic module templates. These systems were seeded with known defects and tested using the above testing and integration strategies. A number of experiments were then conducted using a simulator whose validity was established by comparing results against these artificial systems. The defect detection ability and resulting system reliability were measured for each strategy. Results indicated that top-down integration strategies are generally most effective in terms of defect correction. Top-down and big-bang strategies produced the most reliable systems. Results favored neither those strategies that incorporate spot unit testing nor those that do not; also, results favored neither phased nor incremental strategies

Published in:

Software Engineering, IEEE Transactions on  (Volume:19 ,  Issue: 10 )

Date of Publication:

Oct 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.