Cart (Loading....) | Create Account
Close category search window

Experimental and numerical study of stimulated Raman scattering in an astigmatic focus

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
van den Heuvel, J.C. ; TNO Phys. & Electron. Lab., Hague, Netherlands ; van Putten, F.J.M. ; Lerou, R.J.L.

An astigmatic focus has been used to increase the conversion efficiency of a Raman cell at high pump energy. Experimental and numerical results show that the increased conversion is due to the reduction of cascade second order Stokes. It is shown that other effects, namely Brillouin scattering, anti-Stokes generation, and ground-state depletion, are negligible for the present experimental setup. The experimental and numerical calculations are in agreement. In particular, good agreement was obtained for the cross-over energy, i.e., the pump energy where the ordinary and the astigmatic focus give the same Stokes energy. Below this energy an ordinary focus gives a higher conversion than an astigmatic focus, while above this energy this is reversed

Published in:

Quantum Electronics, IEEE Journal of  (Volume:29 ,  Issue: 8 )

Date of Publication:

Aug 1993

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.