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Distributed scaling approach of MESFETs and its comparison with the lumped-element approach

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1 Author(s)
J. P. Mondal ; Honeywell Inc., Bloomington, MN, USA

An appropriate scaling procedure is described for large four-finger MESFET cells with experimental verification. A comparison is presented between lumped and distributed modeling approaches. The scalability of elements in the equivalent circuit model of a MESFET is discussed

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:37 ,  Issue: 7 )