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Using optimization in circuit design to improve the yield and circuit performance

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2 Author(s)
Doganis, K. ; Electrical Engineering Software Inc., Santa Clara, CA, USA ; Linardes, P.

Circuit simulation, circuit optimization, sensitivity analysis and yield analysis and optimization tools are integrated in the OPSIM system and support a design methodology that improves designer productivity, circuit performance, manufacturing yield and longterm reliability in ICs. Values for circuit parameters are automatically determined to meet a target performance while accounting for process extremes and environmental conditions

Published in:
ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International

Date of Conference: 23-27 Sep 1991

Page(s):
P7 - 7/1-6
Meeting Date :
23 Sep 1991-27 Sep 1991
Print ISBN:
0-7803-0101-3
INSPEC Accession Number:
4387301
Conference Location :
Rochester, NY
Digital Object Identifier :
10.1109/ASIC.1991.242935
Product Type:
Conference Publications

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