Cart (Loading....) | Create Account
Close category search window
 

Investigation of multiple rectangular aperture irises in rectangular waveguide using TEmnx-modes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yang, R. ; Arbeitsbereich Hochfrequenztech., Tech. Univ. Hamburg-Harburg, Germany ; Omar, A.S.

With the use of proper aperture basis functions in conjunction with the moment method and TEmnx-modal expansion, the coupling effect of transverse irises with multiple rectangular coupling apertures in a rectangular waveguide has been investigated. Numerical studies carried out for twin- and triple-aperture coupling irises have been confirmed by the experiments. The simulation result for a Ka-band bandpass filter realized with triple-aperture irises gives a higher stop-band attenuation than that of a filter with single-aperture irises. The use of TEmnx-modal expansion is characterized by the reduction of both computer memory and CPU time requirements during the numerical study as compared with the commonly used TEmn-TMmn modal approach

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:41 ,  Issue: 8 )

Date of Publication:

Aug 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.