Referenced Items are not available for this document.
A new method for measurements on internal nodes in CMOS circuits without severe loading is proposed. The method is based on the use of capacitive pads and can be used up to 200 MHz. Simulations and some practical measurements are demonstrated.
Published in:
Electronics Letters
(Volume:25
,
Issue:
11
)
Date of Publication: 25 May 1989
- Page(s):
- 754 - 756
- ISSN :
- 0013-5194
- INSPEC Accession Number:
- 3431348
- Digital Object Identifier :
- 10.1049/el:19890510
- Date of Current Version :
- 06 August 2002
- Issue Date :
- 25 May 1989
- Sponsored by :
- Institution of Engineering and Technology
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