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Measurements on CMOS circuit internal loads using capacitive pads

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2 Author(s)
Rojder, P. ; LSI Design Center, Linkoping Univ., Sweden ; Svensson, C.

A new method for measurements on internal nodes in CMOS circuits without severe loading is proposed. The method is based on the use of capacitive pads and can be used up to 200 MHz. Simulations and some practical measurements are demonstrated.

Published in:

Electronics Letters  (Volume:25 ,  Issue: 11 )