By Topic

On some reliability estimation problems in random and partition testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Tsoukalas, M.Z. ; Comput. Sci. Program, Univ. of Texas at Dallas, Richardson, TX, USA ; Duran, Joe W. ; Ntafos, S.C.

Studies have shown that random testing can be an effective testing strategy. One of the goals of testing is to estimate the reliability of the program from the test outcomes. The authors extend the Thayer-Lipow-Nelson reliability model (R. Thayer et al., 1978) to account for the cost of errors. They also compare random testing with partition testing by examining upper confidence bounds for the cost weighted performance of the two strategies

Published in:

Software Engineering, IEEE Transactions on  (Volume:19 ,  Issue: 7 )