Analysis of millimeter waveguides on anisotropic substrates using the three-dimensional transmission-line matrix method

A three-dimensional condensed asymmetrical node, variable grid, transmission-line-matrix (TLM) method has been used in analyzing several millimeter waveguides on anisotropic substrates. The dispersion characteristics of image guides together with field and energy confinement properties at millimeter-wave frequencies have been investigated. Edge coupled microstrip line on a uniaxial substrate is analyzed for the even and odd mode dispersion characteristics. The analysis is repeated for bilateral finlines on uniaxial/biaxial substrates. The results obtained using other computational techniques are used in all of these cases to assess the competence of the method.<
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