By Topic

A linear dependence of Fmin on frequency for TET's

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
B. Hughes ; Hewlett-Packard Microwave Technol. Div., Santa Rosa, CA, USA

The minimum noise figure of a FET, expressed in decibels, is shown to increase approximately linearly with frequency to frequencies approaching the FET's fmax. This observation is useful for extrapolating noise figures and provides a simple frequency-of-merit

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:41 ,  Issue: 6 )