Cart (Loading....) | Create Account
Close category search window
 

Generalized Hopfield neural network for concurrent testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ortega, J. ; Departamento de Electronica y Tecnologia de Computadores, Granada Univ., Spain ; Prieto, A. ; Lloris, A. ; Pelayo, F.J.

The use of generalized Hopfield neural networks in designing the checking circuitry of a concurrent testable circuit is discussed. The aliasing probability, a measure for evaluating the performance of the checking circuitry, is provided. It is shown how, by using spectral techniques based on the Reed-Muller transform, the aliasing probability can be expressed as a function of the Reed-Muller coefficients. Therefore, obtaining the checking circuitry means selecting a set of Reed-Muller spectral coefficients, with fewer elements than a given bound, that minimizes the aliasing probability. To apply the neural networks to design the checking circuitry for concurrent testing, the aliasing probability has been used as an energy function, and the Hopfield neural network has been modified to have an associated energy function with any type of polynomial dependence on the processor states

Published in:

Computers, IEEE Transactions on  (Volume:42 ,  Issue: 8 )

Date of Publication:

Aug 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.