Cart (Loading....) | Create Account
Close category search window
 

Redundancy identification/removal and test generation for sequential circuits using implicit state enumeration

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hyunwoo Cho ; Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA ; Hachtel, G.D. ; Somenzi, F.

Finite state machine (FSM) verification based on implicit state enumeration can be extended to test generation and redundancy identification. The extended method constructs the product machine of two FSMs to be compared, and reachability analysis is performed by traversing the product machine to find any difference in I/O behavior. When an output difference is detected, the information obtained by reachability analysis is used to generate a test sequence. This method is complete, and it generates one of the shortest possible test sequences for a given fault. However, applying this method indiscriminately for all faults may result in unnecessary waste of computer resources. An efficient method based on reachability analysis of the fault-free machine (three-phase ATPG) in addition to the powerful but more resource-demanding product machine traversal is presented. The application of these algorithms to the problems of generating test sequences, identifying redundancies, and removing redundancies is reported

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:12 ,  Issue: 7 )

Date of Publication:

Jul 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.