By Topic

Design of pseudoexhaustive testable PLA with low overhead

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Wen-Zen Shen, ; Inst. of Electron., Nat. Chiao Tung Univ., Hsin-Chu, Taiwan ; Gwo-Haur Hwang ; Wen-Jun Hsu ; Yun-Jung Jan

The pseudoexhaustive testing (PET) scheme is an economical approach to testing a large embedded programmable logic array (PLA). The authors propose an efficient algorithm named low overhead PET (LOPET) to partition the product lines. By applying this algorithm, both the area overhead and test length are reduced significantly

Published in:

Computers, IEEE Transactions on  (Volume:42 ,  Issue: 7 )