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Optimal and efficient probabilistic distributed diagnosis schemes

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2 Author(s)
Sunggu Lee ; Dept. of Electron. & Electr. Eng., Pohang Inst. of Sci. & Technol., South Korea ; Shin, K.G.

The distributed self-diagnosis of a multiprocessor/multicomputer system based on interprocessor tests with imperfect fault coverage that permits intermittently faulty processors is addressed. Focusing on probabilistic diagnosis methods, the authors define several different categories of probabilistic diagnosis based on the type of fault syndrome information used in the diagnosis. Rigorous probabilistic analysis is then used to derive diagnosis algorithms optimal in terms of diagnostic accuracy for the diagnosis categories introduced. Analysis and simulations are used to evaluate the performance of the diagnosis algorithms introduced

Published in:

Computers, IEEE Transactions on  (Volume:42 ,  Issue: 7 )

Date of Publication:

Jul 1993

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