Referenced Items are not available for this document.
An a-Si:H orientation detector is presented which can extract both the position and the orientation of an edge passing through it. It is sensitive to half plane, thin line, and even gradient contrast with preferential orientation, and the output signal is independent of the illumination level and the position of the edge in the device area. The device structure is described and experimental results are presented.<
Published in:
Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
Date of Conference: 9-12 Dec. 1990
- Page(s):
- 291 - 294
- Meeting Date :
- 09 Dec 1990-12 Dec 1990
- ISSN :
- 0163-1918
- INSPEC Accession Number:
- 4127205
- Conference Location :
- San Francisco, CA, USA
- Digital Object Identifier :
- 10.1109/IEDM.1990.237172
- Product Type:
- Conference Publications
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