Cart (Loading....) | Create Account
Close category search window
 

Bistatic frequency-swept microwave imaging: Principle, methodology and experimental results

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ding-Bing Lin ; Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan ; Tah-Hsiung Chu

The basic principle, methodology, and experimental results for frequency-swept microwave imaging of continuous shape conducting and discrete line objects in a bistatic scattering arrangement are presented. The theoretical analysis is developed under the assumptions of plane wave illumination and physical optics approximation. The measurement system and calibration procedures are implemented based on plane wave spectrum analysis. Images of three different types of scattering objects reconstructed from the experimental data obtained in the frequency range 7.5-12.5 GHz are shown to be in good agreement with the scattering object geometries. The results demonstrate that this bistatic frequency-swept microwave imaging system has potential as a cost-effective tool for remote sensing, imaging radar, and nondestructive evaluation

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:41 ,  Issue: 5 )

Date of Publication:

May 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.