By Topic

Temporal and spatial spectral features of B-scan images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
R. Murthy ; Dept. of Electr. & Comput. Eng., Drexel Univ., Philadelphia, PA, USA ; N. M. Bilgutay ; X. Li

B-scan images of metals are frequently used in ultrasonic nondestructive evaluation for flaw detection purposes. Often, the backscattered grain noise masks the flaw echo, making it difficult to visually distinguish the flaw signal from the grain echoes. Previously, spatial and frequency compounding, as well as decorrelation techniques have been used to enhance the flaw echo. The partial spectra, i.e., the temporal or spatial frequency components of the B-scan image, are used individually to obtain information regarding the flaw location. It is observed that the partial spectra behave in a distinct manner when the B-scan contains a flaw, and provide more insight than the conventional two-dimensional spectrum. Using this information, a two-dimensional filter that significantly suppresses grain noise can be designed. Experimental results using data from stainless steel samples are presented

Published in:

Ultrasonics Symposium, 1991. Proceedings., IEEE 1991

Date of Conference:

8-11 Dec 1991