Cart (Loading....) | Create Account
Close category search window

Automated Josephson integrated circuit test system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Burroughs, C.J. ; Nat. Inst. of Sci. & Technol., Boulder, CO, USA ; Hamilton, C.A.

An automated test system for complex superconductive integrated circuits has been developed. Its low-speed capability consists of 96 identical input/output (I/O) channels controlled by a PC-486 computer. Each channel is capable of driving currents and reading voltages at frequencies up to 40 kHz. Integrating this low-speed I/O capability with high-speed test equipment controlled over the IEEE bus allows measurements at frequencies up to the limits of the test equipment. The system can automatically set biases, display I-V curves, measure parameter margins, plot threshold curves, extract experimental circuit values, and collect statistical data on parameter spreads and error rates. Issues of noise suppression, ground loop handling, and autocalibration are discussed.<>

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:3 ,  Issue: 1 )

Date of Publication:

March 1993

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.