Cart (Loading....) | Create Account
Close category search window
 

Characterization of flow in sub-scale cable-in-conduit conductors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Daugherty, M.A. ; Appl. Superconductivity Center, Wisconsin Univ., Madison, WI, USA ; Maekawa, R. ; van Sciver, S.W.

The authors measured the pressure drop of supercritical helium and He II counterflow heat transport in subscale cable-in-conduit conductors (CICCs) at a variety of different temperatures. These measurements were made on various conductors with different flow areas, void fractions, and strand diameters. Classical friction factor analysis was used to correlate the pressure drop results. The results of this analysis revealed systematic variations in the friction factor which appear to be dependent on the temperature of the helium. In a separate experiment heat transport in He II contained in the CICCs was analyzed in terms of the Gorter-Mellink relationship to obtain an independent determination of the flow cross-sectional area. These cross-sectional areas were used to reanalyze previously reported pressure drop data on the same conductors. Use of He II counterflow measurements as a general method to characterize the hydraulics of these conductors is discussed.<>

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:3 ,  Issue: 1 )

Date of Publication:

March 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.