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Browse Conference Publications > VLSI Test Symposium, 1992. '1 ... Help

Built-in current self-testing scheme (BICST) for CMOS logic circuits

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1 Author(s)
Qiao Tong ; Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA

A novel scheme for built-in self-testing used in current testing environment (named BICST) is presented in this paper. Test vectors are generated on chip in BICST to detect the stuck-on and bridging faults as well as stuck-at faults in a CMOS circuit. The test set generated by pseudo-exhaustive testing method can detect stuck-on and bridging faults that cause abnormal large current flow in the circuit, which will be caught by the built-in current sensors. Partitioning is done for pseudo-exhaustive testing and to obtain high resolution in current measuring. The overall structure of the BICST system is also presented.<>

Published in:
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE

Date of Conference: 7-9 April 1992

Page(s):
304 - 308
Meeting Date :
07 Apr 1992-09 Apr 1992
Print ISBN:
0-7803-0623-6
INSPEC Accession Number:
4403002
Conference Location :
Atlantic City, NJ, USA
Digital Object Identifier :
10.1109/VTEST.1992.232770
Product Type:
Conference Publications

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