Cart (Loading....) | Create Account
Close category search window
 

A simulation-based approach to test pattern generation for synchronous sequential circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Camurati, P. ; Dipartimento di Autom. e Inf., Politecnico di Torino, Turin, Italy ; Corno, F. ; Prinetto, P. ; Reorda, M.S.

Particular design environments, e.g., those based on partial scan, may prevent design for testability techniques from reducing testing to a combinational problem: ATPG for sequential devices thus remains a challenge. Random and deterministic structure-oriented techniques are state-of-the-art, but there is a growing interest in methods that resort to the automaton of the circuit. The authors present SETA, a sequential test generator based on automata, an ATPG applicable to synchronous circuits working in the fundamental mode. SETA generates test patterns while trying to disprove the equivalence of two automata. SETA is simulation-based: within the theoretical framework of the product machine, state-of-the-art simulation techniques are used to yield satisfactory experimental results on the ISCAS89 benchmark set.<>

Published in:

VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE

Date of Conference:

7-9 April 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.