By Topic

Corrosion of thin film aluminum metallization: conformal coating materials

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Osenbach, J.S. ; AT&T Bell Lab., Allentown, PA, USA ; Zell, J.L.

The authors report their results on the THB performance of triple-track-tester (TTT) devices coated with room temperature vulcanized silicon rubber (RTV), silicon resin, silicon polyimide, or silicon gel. Devices with each of these conformal coating materials were aged at 85 C/85% relative humidity (RH)/A, where 40→400 V, for times up to 14000 h. It is found that the median time-to-fail is exponentially related to the applied voltage. The median life at 300 V is in excess of 30000 h for the silicon-gel-coated samples. 10000 h for the RTV-coated samples, 3000 h for the silicon-resin-coated samples, and 2000 h for the polyimide-coated samples. The difference in the median life times is due to differences in the interface bond strength between the polymer coat and the device surface

Published in:

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:16 ,  Issue: 3 )