By Topic

Parameter extraction of microwave transistors using a hybrid gradient descent and tree annealing approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
S. G. Skaggs ; High Frequency Electron. Lab., North Carolina State Univ., Raleigh, NC, USA ; J. Gerber ; G. Bilbro ; M. B. Steer

Tree annealing is a robust optimization scheme which can be used to find the valleys of an error surface. The problem of entrapment in local minima is not a factor with this type of optimization, but it is much slower than gradient-based techniques. The method presented here attempts to take advantage of the speed of gradient-based methods and of the efficient pseudorandom searching abilities of tree annealing. The result is a technique which behaves as a directed multistart gradient method. All minima encountered during optimization are recorded, thus providing alternatives in case of a nonphysical final solution. The technique is used in the extraction of a modified Materka-Kacprzak model of a GaAs MESFET

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:41 ,  Issue: 4 )