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The influence of metallization thickness on the characteristics of cascaded junction discontinuities of shielded coplanar type transmission line

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2 Author(s)
Huang, T.-W. ; Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA ; Itoh, T.

A full-wave analysis based on the mode-matching technique is applied to analyze cascaded junction discontinuities of coplanar-type transmission lines, coplanar waveguide (CPW) and finline. Results for a CPW-finline transition, a shielded CPW gap and a symmetric notch incorporating the finite metallization thickness effect are presented. The influence of metallization thickness on the coupling effect exhibited by cascaded junction discontinuities is also presented and discussed

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Microwave Theory and Techniques, IEEE Transactions on  (Volume:41 ,  Issue: 4 )