By Topic

An improved de-embedding technique for the measurement of the complex constitutive parameters of materials using a stripline field applicator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hanson, G.W. ; Dept. of Elec. Eng. & Comput. Sci., Wisconsin Univ., Milwaukee, WI, USA ; Grimm, J.M. ; Nyquist, D.P.

A method for measuring the electromagnetic constitutive parameters of materials using a strip-transmission-line field applicator is presented. A technique is developed to measure the scattering parameters of the imperfect transition regions between the applicator coaxial terminal ports and the front and back terminal planes of the material sample in stripline, S-parameters of the sample region are subsequently deembedded from the coaxial-terminal model. The complex permittivity and permeability of the sample are easily related to the sample's S-parameters through well-known analytic relations. Measured constitutive parameters are presented for several representative materials

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:42 ,  Issue: 3 )