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Nonlinear effects in transistors caused by thermal power feedback: simulation and modeling in SPICE

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4 Author(s)
Schurack, E. ; Inst. for Commun. Eng., Federal Armed Forces Univ., Munich, Neubiberg, Germany ; Latzel, T. ; Rupp, W. ; Gottwald, A.

In order to evaluate the influence of the internal power dependent thermally effected feedback in bipolar transistors, a model for SPICE simulation is proposed which considers several variable temperature influences on transistor parameters as well as a complex thermal network. Measurement methods for determination of essential parameter values are suggested. Results of SPICE simulations are presented

Published in:

Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on  (Volume:2 )

Date of Conference:

10-13 May 1992