Cart (Loading....) | Create Account
Close category search window
 

Experimental results and modeling techniques for switching noise in mixed-signal integrated circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Loinaz, M.J. ; Stanford Univ., CA, USA ; Su, D.K. ; Wooley, B.A.

In mixed-signal integrated circuits, fast transients in digital circuits can perturb other circuits on the same die through both direct capacitive coupling between circuit nodes and interaction via the common substrate. The effects of substrate excitation by fast switching digital circuits are reported. Experimental results and modeling techniques presented apply to CMOS technologies with heavily doped substrates and the experimental method can also be used to study switching noise when the substrate is lightly doped.<>

Published in:

VLSI Circuits, 1992. Digest of Technical Papers., 1992 Symposium on

Date of Conference:

4-6 June 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.