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Experimental results and modeling techniques for switching noise in mixed-signal integrated circuits

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3 Author(s)
M. J. Loinaz ; Stanford Univ., CA, USA ; D. K. Su ; B. A. Wooley

In mixed-signal integrated circuits, fast transients in digital circuits can perturb other circuits on the same die through both direct capacitive coupling between circuit nodes and interaction via the common substrate. The effects of substrate excitation by fast switching digital circuits are reported. Experimental results and modeling techniques presented apply to CMOS technologies with heavily doped substrates and the experimental method can also be used to study switching noise when the substrate is lightly doped.<>

Published in:

VLSI Circuits, 1992. Digest of Technical Papers., 1992 Symposium on

Date of Conference:

4-6 June 1992