Referenced Items are not available for this document.
A data compression technique called self-testable and error-propagating space compression is proposed and analyzed. Faults in a realization of Exclusive-OR and Exclusive-NOR gates are analyzed, and the use of these gates in the design of self-testing and error propagating space compressors is discussed. It is argued that the proposed data-compression technique reduce the hardware complexity in built-in self-test (BIST) logic designs using external tester environments
Published in:
Computers, IEEE Transactions on
(Volume:37
,
Issue:
9
)
Date of Publication: Sep 1988
- Page(s):
- 1151 - 1156
- ISSN :
- 0018-9340
- INSPEC Accession Number:
- 3252219
- Digital Object Identifier :
- 10.1109/12.2271
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Sep 1988
- Sponsored by :
- IEEE Computer Society
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