Cart (Loading....) | Create Account
Close category search window
 

A test generation algorithm for systems modelled as non-deterministic FSMs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
AboElFotoh, H. ; Dept. of Comput. Sci., American Univ., Cairo, Egypt ; Abou-Rabia, O. ; Ural, H.

A variety of systems can be modelled as finite-state machines (FSM). Several formal methods have been proposed for testing the conformance of an implementation to a given FSM-based specification. However, all of these methods assume that the specification is modelled by a deterministic FSM. The paper presents an efficient algorithm that generates a set of adaptive all state-pair optimised distinguishing sequences for testing systems modelled as non-deterministic FSMs

Published in:

Software Engineering Journal  (Volume:8 ,  Issue: 4 )

Date of Publication:

Jul 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.