Cart (Loading....) | Create Account
Close category search window
 

Nonlinear estimation of scene parameters from digital images using zero-hit-length statistics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Chen, R. ; Res. & Data Syst. Corp., Greenbelt, MD, USA ; Jupp, D.L.B. ; Woodcock, C.E. ; Strahler, A.H.

A zero-hit run-length probability model for image statistics is derived. The statistics are based on the lengths of runs of pixels that do not include any part of objects that define a scene model. The statistics are used to estimate the density and size of the discrete objects (modeled as disks) from images when the image pixel size is significant relative to the object size. Using different combinations of disk size, density, and image resolution (pixel size) in simulated images, parameter estimation may be used to investigate the essential invertibility of object size and density. Analysis of the relative errors and 95% confidence intervals indicates the accuracy and reliability of the estimates. An integrated parameter r, reveals relationships between errors and the combinations of the three basic parameters of object size, density, and pixel size. The method may be used to analyze real remotely sensed images if simplifying assumptions are relaxed to include the greater complexity found in real data

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:31 ,  Issue: 3 )

Date of Publication:

May 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.