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A simple method for noise tolerance characterization of digital circuits

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3 Author(s)
Simovich, S. ; Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA ; Franzon, P. ; Steer, M.

A method for characterizing dynamic noise tolerance of digital circuits is discussed. In this method noise impulses are characterized by their energy, voltage and width. The method is intended for use in simulation-based noise analysis and design of receiver circuits in digital systems

Published in:

VLSI, 1993. 'Design Automation of High Performance VLSI Systems', Proceedings., Third Great Lakes Symposium on

Date of Conference:

5-6 Mar 1993