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ESD: a pervasive reliability concern for IC technologies

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2 Author(s)
Duvvury, C. ; Texas Instrum. Inc., Dallas, TX, USA ; Amerasekera, A.

Several aspects of ESD are described from the point of view of the test, design, product, and reliability engineering. A review of the ESD phenomena along with the test methods, the appropriate on-chip protection techniques, and the impact of process technology advances from CMOS to BiCMOS on the ESD sensitivity of IC protection circuits are presented. The status of understanding in the field of ESD failure physics and the current approaches for modeling are discussed

Published in:

Proceedings of the IEEE  (Volume:81 ,  Issue: 5 )

Date of Publication:

May 1993

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