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Microprocessors functional testing techniques

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3 Author(s)
Talkhan, E.-S.A. ; Dept. of Electron. & Commun., Cairo Univ., Giza, Egypt ; Ahmed, A.M.H. ; Salama, A.E.

The authors address the functional testing of microprocessors. A method is introduced for obtaining a minimum set of instructions that replaces the whole instruction set during testing procedure. The method is illustrated on the digital signal processor TM32010

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:8 ,  Issue: 3 )